Title : IMPLEMENTATION OF SEED FLIPPING TEST PATTERN TO DETECT FAULTS IN LBIST
Author : Mr. T. Gangadhar, Ms.Y.Anitha, Ms. G. Usha
Abstract :
Design and manufacturing challenges posed by the increasing transistor count and shrinking feature size in modern chips have significantly heightened the occurrence of defects. As a result, rigorous testing has become indispensable in the VLSI design process. Unfortunately, amidst the lengthy design cycles, test procedures often take a back seat, overshadowed by the primary focus on design development. To ensure high quality and reliability, it is imperative that any VLSI design be entirely fault-free before deployment. Design for Testability (DFT) techniques play a crucial role in facilitating error detection and ensuring robustness during testing phases. Among these techniques, Logic Built in Self-Test (LBIST) stands out for its effectiveness in achieving comprehensive fault coverage. Here it is implemented LBIST with a focus on enhancing fault coverage for a 16-bit test pattern using SFRG (Seed Flipping Ring Generator). This approach not only maximizes fault detection capabilities b
